MEASUREMENT INSTRUMENT AND SYSTEM FOR ENHANCED CONSTELLATION DIAGRAMS AND METHOD THEREOF

Abstract: the present invention relates to a measurement instrument comprising: at least a first and a second input paths, wherein each input path is configured to receive a corresponding measurement signal from a device under test, wherein each measurement signal comprises a number of states; a calculation device connected to the at least first and second input paths, configured to calculate an error vector corresponding to each state of each measurement signal, and to produce an average error vector for each state based on the error vectors of each measurement signal corresponding to the same state; and a display device, adapted to create a constellation diagram based on the produced average error vector for each state.

Inventor(s): Peter Myerscough-Jackopson

CPC Classification: G01R31/2822 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits ;} testing for short-circuits, discontinuities, leakage or incorrect line connection ; checking computers {or computer components} ; checking static stores for correct operation {; testing receivers or transmitters of transmission systems }))

Search for rejections for patent application number 20250164546