NOISE ANALYSIS APPARATUS, NOISE ANALYSIS METHOD, AND PROGRAM

Abstract: a time range setting unit acquires a plurality of occurrence times at which switching of a semiconductor device occurs a plurality of times, respectively. a phase transform units generates a plurality of pieces of phase difference information for subjecting a noise spectrum in the switching of the semiconductor device to a phase transform to reflect a time difference between the plurality of occurrence times. an addition unit adds together a plurality of noise spectra that are obtained through a phase transform of the noise spectrum in the switching of the semiconductor device by the plurality of pieces of phase difference information, respectively, to calculate a result of calculating a sum spectrum generated by the switching of the semiconductor device.

Inventor(s): Keita TAKAHASHI

CPC Classification: G01R29/26 (Measuring noise figure; Measuring signal-to-noise ratio)

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