SEMICONDUCTOR DEVICE, TEST APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR CHIP

Abstract: in an embodiment of the present disclosure, the frequency of a test signal and the speed of a test for a second circuit block to be tested are adjusted based on a measurement value for a first circuit block which represents the characteristics of a semiconductor device. therefore, the efficiency of a test on the semiconductor device may be improved by reducing a time required for the entire test while maintaining the stability and performance of the test.

Inventor(s): Chul Hee OH

CPC Classification: G01R23/02 (Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage)

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