SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

Abstract: disclosed is a specimen measurement apparatus configured to measure a specimen, including: a housing; a first rack tray configured to store therein a rack capable of holding a plurality of specimen containers, the first rack tray being able to be taken in and out with respect to the housing; a second rack tray configured to store therein a rack capable of holding a plurality of specimen containers, the second rack tray being able to be taken in and out with respect to the housing, independently from the first rack tray; and a controller programmed to perform a process related to measurement of the specimen, according to a normal mode or an urgent mode that is set as specimen measurement mode for each of the racks, the urgent mode being higher in urgency in measurement than the normal mode. when a rack in the normal mode and a rack in the urgent mode are stored in the housing, the controller preferentially performs measurement of the specimen held in the rack in the urgent mode.

Inventor(s): Hisashi NAKATSUKA

CPC Classification: G01N35/0095 (Automatic analysis not limited to methods or materials provided for in any single one of groups - ; Handling materials therefor)

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