PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

Abstract: a particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. a particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. an analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

Inventor(s): Hirosuke SUGASAWA, Yasuhiro TATEWAKI, Tatsuo IGUSHI

CPC Classification: G01N15/1434 (Optical investigation techniques, e.g. flow cytometry)

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