19020531. LIGHT FIELD DISPLAY METROLOGY (Magic Leap, Inc.)
LIGHT FIELD DISPLAY METROLOGY
Organization Name
Inventor(s)
Ivan Li Chuen Yeoh of Wesley Chapel FL US
Lionel Ernest Edwin of Hollywood FL US
Samuel A. Miller of Hollywood FL US
LIGHT FIELD DISPLAY METROLOGY
This abstract first appeared for US patent application 19020531 titled 'LIGHT FIELD DISPLAY METROLOGY
Original Abstract Submitted
Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths or lateral focus positions for various regions of the light field using the captured images. The determined focus depths or lateral positions may then be compared with intended focus depths or lateral positions, to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.
- Magic Leap, Inc.
- Ivan Li Chuen Yeoh of Wesley Chapel FL US
- Lionel Ernest Edwin of Hollywood FL US
- Samuel A. Miller of Hollywood FL US
- G01B11/14
- G01B11/22
- G02B27/01
- G06F3/01
- G06T3/20
- G06T3/40
- G06T3/60
- G06T15/20
- G06T19/00
- G09G3/00
- G09G3/20
- G09G3/34
- G09G5/02
- H04N13/144
- H04N13/327
- H04N13/344
- H04N13/383
- H04N13/395
- H04N13/398
- CPC G01B11/14