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19015772. PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD (Tokyo Electron Limited)

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PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Organization Name

Tokyo Electron Limited

Inventor(s)

Tangkuei Wang of Miyagi JP

Tetsuya Ohishi of Miyagi JP

Masafumi Urakawa of Miyagi JP

Shinya Morikita of Miyagi JP

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

This abstract first appeared for US patent application 19015772 titled 'PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Original Abstract Submitted

In a plasma processing apparatus disclosed, a controller performs repetition of a cycle. The cycle includes supplying a pulse of a source high-frequency power from a high-frequency power supply for generating plasma from gas in a chamber, and supplying a pulse of an electric bias to a substrate support from a bias power supply. The pulse of the electric bias includes a direct current voltage pulse periodically generated at a bias frequency of 1 MHz or less. A repetition frequency of the cycle is 5 kHz or more. A start timing of the pulse of the electric bias is simultaneous with or earlier than a stop timing of the pulse of the source high-frequency power. A stop timing of the pulse of the electric bias is later than the stop timing of the pulse of the source high-frequency power.

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