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19004463. PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS (Tokyo Electron Limited)

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PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Organization Name

Tokyo Electron Limited

Inventor(s)

Naoki Matsumoto of Miyagi JP

Toshihisa Ozu of Miyagi JP

Satoru Nakamura of Miyagi JP

Yusuke Shimizu of Gyeonggi-do KR

PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

This abstract first appeared for US patent application 19004463 titled 'PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Original Abstract Submitted

A technology for reducing variation in an ion flux distribution will be provided. There is provided a plasma processing method for performing plasma processing in a plasma processing apparatus including a chamber and a substrate support disposed in the chamber, the plasma processing performed on a substrate placed at the substrate support by generating plasma in the chamber. The plasma processing method includes: (a) the step of storing, in memory, first distribution data that is data relating to a distribution of an ion flux that occurs between the plasma generated in the chamber and a first substrate placed at the substrate support; (b-a) the step of placing a second substrate at the substrate support; and (b-b) a plasma processing step of generating the plasma in the chamber based on the first distribution data to perform the plasma processing on the second substrate.

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