18987505. EVALUATING MEASUREMENTS USING INFORMATION FROM MULTIPLE MEASURING DEVICES (Alcon Inc.)
EVALUATING MEASUREMENTS USING INFORMATION FROM MULTIPLE MEASURING DEVICES
Organization Name
Inventor(s)
George Hunter Pettit of Fort Worth TX US
[[:Category:Martin Gr�ndig of Rangsdorf DE|Martin Gr�ndig of Rangsdorf DE]][[Category:Martin Gr�ndig of Rangsdorf DE]]
Mark Andrew Zielke of Lake Forest CA US
John Alfred Campin of Southlake CA US
EVALUATING MEASUREMENTS USING INFORMATION FROM MULTIPLE MEASURING DEVICES
This abstract first appeared for US patent application 18987505 titled 'EVALUATING MEASUREMENTS USING INFORMATION FROM MULTIPLE MEASURING DEVICES
Original Abstract Submitted
An ophthalmic system for measuring an eye comprises measuring devices and a computer. The measuring devices comprise an optical coherence tomography (OCT) device and an aberrometer. The OCT device directs OCT light towards the eye, and detects the OCT light reflected from the eye to measure the eye. The aberrometer directs aberrometer light towards the eye, and detects the aberrometer light reflected from the eye to measure the eye. The computer generates an ocular model of the eye according to the reflected OCT light. The ocular model comprises parameters for the eye, where each parameter is assigned a value. The computer determines an OCT-based wavefront according to the ocular model, determines an aberrometer-based wavefront according to the reflected aberrometer light, ascertains a deviation between the OCT-based wavefront and the aberrometer-based wavefront, and evaluates measurements from one or more of the measuring devices according to the deviation.
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