Jump to content

18984957. METHODS OF FABRICATING SEMICONDUCTOR DEVICES (SAMSUNG ELECTRONICS CO., LTD.)

From WikiPatents

METHODS OF FABRICATING SEMICONDUCTOR DEVICES

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Uihyoung Lee of Hwaseong-si KR

Honyun Park of Hwaseong-si KR

Jongseok Lee of Hwaseong-si KR

Sewan Kim of Suwon-si KR

Taesung Lee of Seoul KR

METHODS OF FABRICATING SEMICONDUCTOR DEVICES

This abstract first appeared for US patent application 18984957 titled 'METHODS OF FABRICATING SEMICONDUCTOR DEVICES

Original Abstract Submitted

A method of fabricating a semiconductor device includes forming a dielectric layer on a lower structure. The method includes forming an opening to penetrate through the dielectric layer. The method includes alternately repeating a first operation, in which a first sputtering deposition process is performed to form a first metal pattern in the opening, and a second operation, in which a second sputtering deposition process is performed to form a second metal pattern in the opening, two or more times to form a first metal layer. The method includes forming a second metal layer on the first metal layer in an electroplating manner, and planarizing the first and second metal layers. Moreover, first and second process times, during which the first sputtering deposition process and the second sputtering deposition process, respectively, are performed, are each about five seconds or less.

Cookies help us deliver our services. By using our services, you agree to our use of cookies.