18929520. MEASUREMENT SYSTEM (ARKRAY, Inc.)

MEASUREMENT SYSTEM

Organization Name

ARKRAY, Inc.

Inventor(s)

Toru Odagaki of Kyoto-shi JP

Hyuga Sasaki of Kyoto-shi JP

MEASUREMENT SYSTEM

This abstract first appeared for US patent application 18929520 titled 'MEASUREMENT SYSTEM

Original Abstract Submitted

A measurement system including a first element in which a test sample carrier applied with a test sample suspected to contain a measurement target is to be held, a second element to which the first element is assembled, an imaging section capturing a verification area containing a measurement region in which the measurement target in the test sample applied to the test sample carrier is to be positioned in the first element and acquiring a verification image, and an analysis section analyzing the verification image and detecting an assembly error of the first element.