18928815. MEASUREMENT APPARATUS (TDK Corporation)
MEASUREMENT APPARATUS
Organization Name
Inventor(s)
Kensuke Sekihara of Hachioji-shi JP
MEASUREMENT APPARATUS
This abstract first appeared for US patent application 18928815 titled 'MEASUREMENT APPARATUS
Original Abstract Submitted
A measurement apparatus includes a signal sensor unit configured to measure a measurement signal in which a target signal and first noise are mixed and detect a first noise signal of which a level of a component of the target signal is lower than a predetermined value and which includes the first noise, and include one or more signal sensors; and a processing unit performing processing of reducing a component of the first noise included in measurement data by data partitioned factor analysis on the basis of the measurement data that is data of the measurement signal measured by the signal sensor unit and control data that is data of the first noise signal measured by the signal sensor unit.