18925522. METHOD AND CIRCUITRY FOR DETERMINING SYSTEM CHARACTERISTICS OF AN ELECTRONIC CIRCUIT (Arm Limited)
METHOD AND CIRCUITRY FOR DETERMINING SYSTEM CHARACTERISTICS OF AN ELECTRONIC CIRCUIT
Organization Name
Inventor(s)
Rainer Herberholz of Great Abington GB
METHOD AND CIRCUITRY FOR DETERMINING SYSTEM CHARACTERISTICS OF AN ELECTRONIC CIRCUIT
This abstract first appeared for US patent application 18925522 titled 'METHOD AND CIRCUITRY FOR DETERMINING SYSTEM CHARACTERISTICS OF AN ELECTRONIC CIRCUIT
Original Abstract Submitted
The present techniques relate to a method and circuitry for determining system characteristics of an electronic circuit and there is disclosed a delay monitor circuit to characterise an electronic circuit comprising: a delay line that quantifies the delay within a clock cycle; the delay line comprising a plurality of sampling points therealong; wherein, in a first mode, the delay monitor is configured to capture delay statistics over a given measurement period; and wherein, in a second mode, the delay monitor is configured to capture a measurement value from the plurality of sampling points, wherein the measurement value is indicative of one or more characteristics of the electronic circuit.