18894090. Interferometer (SEIKO EPSON CORPORATION)
Interferometer
Organization Name
Inventor(s)
Interferometer
This abstract first appeared for US patent application 18894090 titled 'Interferometer
Original Abstract Submitted
An interferometer including an analysis optical system including a retroreflector configured to reflect analysis light and a first light receiver configured to receive the analysis light and output a first light reception signal, the analysis optical system irradiating a sample with the analysis light and causing the analysis light to interfere; a length measuring optical system including a laser light source configured to output laser light, an optical modulator configured to modulate a frequency of the laser light by using a vibrator and add a modulation component to the laser light, and a second light receiver configured to receive the laser light containing the modulation component and a length measurement component generated when the retroreflector is irradiated with the laser light and output a second light reception signal, the length measuring optical system causing the laser light to interfere; and a driver configured to change a position of the retroreflector.