18893483. DYNAMIC ANALYSIS AND MONITORING OF MACHINE LEARNING PROCESSES (The Toronto-Dominion Bank)
DYNAMIC ANALYSIS AND MONITORING OF MACHINE LEARNING PROCESSES
Organization Name
Inventor(s)
Kin Kwan Leung of Toronto (CA)
Maksims Volkovs of Toronto (CA)
Tomi Johan Poutanen of Toronto (CA)
DYNAMIC ANALYSIS AND MONITORING OF MACHINE LEARNING PROCESSES
This abstract first appeared for US patent application 18893483 titled 'DYNAMIC ANALYSIS AND MONITORING OF MACHINE LEARNING PROCESSES
Original Abstract Submitted
The disclosed embodiments include computer-implemented processes that flexibly and dynamically analyze a machine learning process, and that generate analytical output characterizing an operation of the machine learning process across multiple analytical periods. For example, an apparatus may receive an identifier of a dataset associated with the machine learning process and feature data that specifies an input feature of the machine learning process. The apparatus may access at least a portion of the dataset based on the received identifier, and obtain, from the accessed portion of the dataset, a feature vector associated with the machine learning process. The apparatus may generate a plurality of modified feature vectors based on the obtained feature vector, and based on an application of the machine learning process to the obtained and modified feature vectors, generate and transmit, to a device, first explainability data associated with the specified input feature for presentation within a digital interface.
