18836699. SIGNAL MEASUREMENTS (Nokia Technologies Oy)
SIGNAL MEASUREMENTS
Organization Name
Inventor(s)
Panagiotis Spapis of Munich DE
Subhyal Bin Iqbal of Munich DE
[[:Category:Halit Murat G�rsu of Munich DE|Halit Murat G�rsu of Munich DE]][[Category:Halit Murat G�rsu of Munich DE]]
SIGNAL MEASUREMENTS
This abstract first appeared for US patent application 18836699 titled 'SIGNAL MEASUREMENTS
Original Abstract Submitted
An apparatus, method and computer program is described comprising: obtaining signal measurements from a plurality of antenna panels of a user device at respective first sampling rates corresponding to each of the plurality of antenna panels, wherein a rate at which each of the plurality of antenna panels perform signal measurements is determined based on the respective first sampling rates; determining whether a first condition is satisfied or whether a second condition is satisfied, wherein at least one of the first condition or the second condition relates to a probability of an inbound handover; and increasing at least one of the respective first sampling rates to one or more respective second sampling rates in response to determining that the first condition is satisfied, or decreasing at least one of the first sampling rates to one or more respective third sampling rates in response to determining that the second condition is satisfied.
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