NON-INVASIVE SUBSTANCE ANALYSIS APPARATUS

Organization Name

Mitsubishi Electric Corporation

Inventor(s)

Yuki Tsuda of Chiyoda-ku, Tokyo (JP)

Shusaku Hayashi of Chiyoda-ku, Tokyo (JP)

Koichi Akiyama of Chiyoda-ku, Tokyo (JP)

NON-INVASIVE SUBSTANCE ANALYSIS APPARATUS

This abstract first appeared for US patent application 18834630 titled 'NON-INVASIVE SUBSTANCE ANALYSIS APPARATUS

Original Abstract Submitted

A non-invasive substance analysis apparatus includes: a sample support plate; an excitation light source; and a temperature sensor. The sample support plate has a main surface including a sample placement region, and a main surface opposite to the main surface. The temperature sensor is provided on the main surface. A through hole extending from the sample placement region to the main surface is provided in the sample support plate. Excitation light emitted from the excitation light source is applied to a sample placed on the sample placement region through the through hole.