18823768. JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD (Samsung Electronics Co., Ltd.)
JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD
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JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD
This abstract first appeared for US patent application 18823768 titled 'JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD
Original Abstract Submitted
A jitter measurement circuit for measuring a jitter of an input signal, the jitter measurement circuit including: a multiplexer configured to output a first comparison signal or a second comparison signal in response to an output signal; a detecting circuit configured to output a detection signal corresponding to a phase difference between an output of the multiplexer and the input signal; a first adder configured to sum the detection signal and a feedback signal; an integrating circuit configured to integrate and output an output of the first adder; a feedback circuit configured to trim an output of the integrating circuit to generate the feedback signal; and a comparator configured to generate an output signal by comparing the output of the integrating circuit with a reference potential.