18762952. TOUCH INTEGRATED CIRCUIT INSPECTION DEVICE (SAMSUNG DISPLAY CO., LTD.)
TOUCH INTEGRATED CIRCUIT INSPECTION DEVICE
Organization Name
Inventor(s)
KYUSHIK Shin of Yongin-si (KR)
JUN-YOUNG Ko of Yongin-si (KR)
TAEHYEON Yang of Yongin-si (KR)
TOUCH INTEGRATED CIRCUIT INSPECTION DEVICE
This abstract first appeared for US patent application 18762952 titled 'TOUCH INTEGRATED CIRCUIT INSPECTION DEVICE
Original Abstract Submitted
A touch integrated circuit (IC) inspection device includes: an inspection board electrically connected to a touch IC; and an inspection circuit that receives an inspection result from the touch IC, wherein the inspection board includes: a plurality of first electrodes, each of which extends in a first direction and which are spaced apart from one another in a second direction that intersects the first direction; and a plurality of second electrodes, each of which extends in the second direction and which are spaced apart from one another in the first direction, and wherein a number of the plurality of first electrodes is a same as a number of the plurality of second electrodes.
