18752815. SAMPLE MEASURING APPARATUS (Konica Minolta, Inc.)
SAMPLE MEASURING APPARATUS
Organization Name
Inventor(s)
Katsunori Takahashi of Tokyo (JP)
SAMPLE MEASURING APPARATUS
This abstract first appeared for US patent application 18752815 titled 'SAMPLE MEASURING APPARATUS
Original Abstract Submitted
The sample measuring apparatus includes: a measuring device that measures a sample; a conveyance device that uses cassettes each having a plurality of stages capable of storing a plurality of samples having different sizes, takes out each sample one by one from a cassette serving as a pickup source among the cassettes, conveys the sample to the measuring device, and stores the sample measured by the measuring device into a cassette serving as a placement destination among the cassettes; a sample detector capable of detecting presence or absence of the sample in each stage of each of the cassettes; and a controller that controls the measuring device and the conveyance device based on a result of the detection by the sample detector.