18748746. POLARIZATION INDEPENDENT OPTOELECTRONIC DEVICE AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED)
POLARIZATION INDEPENDENT OPTOELECTRONIC DEVICE AND METHOD
Organization Name
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
Inventor(s)
Feng Wei Kuo of Zhudong Township (TW)
Huan-Neng Chen of Taichung City (TW)
Lan-Chou Cho of Hsinchu City (TW)
POLARIZATION INDEPENDENT OPTOELECTRONIC DEVICE AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18748746 titled 'POLARIZATION INDEPENDENT OPTOELECTRONIC DEVICE AND METHOD
The device described in the abstract includes a scattering structure and a collection structure that work together to scatter incident electromagnetic radiation along non-orthogonal axes and detect the scattered radiation for further analysis.
- The scattering structure scatters electromagnetic radiation along two non-orthogonal axes simultaneously.
- The collection structure includes input ports aligned with the scattering axes for detecting the scattered radiation.
- The method involves detecting the scattered radiation along the non-orthogonal axes and aligning the phases of the detected radiation.
Potential Applications: - Remote sensing - Imaging systems - Communication technologies
Problems Solved: - Efficient scattering and collection of electromagnetic radiation along non-orthogonal axes - Improved detection and alignment of scattered radiation phases
Benefits: - Enhanced accuracy in detecting and analyzing electromagnetic radiation - Increased efficiency in scattering and collecting radiation along different axes
Commercial Applications: Title: Advanced Remote Sensing Technology for Enhanced Imaging Systems This technology can be used in satellite imaging systems, communication technologies, and remote sensing applications, providing more accurate and efficient data collection and analysis.
Questions about the technology: 1. How does this technology improve upon existing methods of scattering and collecting electromagnetic radiation? 2. What are the potential limitations of aligning the phases of detected radiation in this system?
Original Abstract Submitted
A device includes a scattering structure and a collection structure. The scattering structure is arranged to concurrently scatter incident electromagnetic radiation along a first scattering axis and along a second scattering axis. The first scattering axis and the second scattering axis are non-orthogonal. The collection structure includes a first input port aligned with the first scattering axis and a second input port aligned with the second scattering axis. A method includes scattering electromagnetic radiation along a first scattering axis to create first scattered electromagnetic radiation and along a second scattering axis to create second scattered electromagnetic radiation. The first scattering axis and the second scattering axis are non-orthogonal. The first scattered electromagnetic radiation is detected to yield first detected radiation and the second scattered electromagnetic radiation is detected to yield second detected radiation. The first detected radiation is phase aligned with the second detected radiation.