IMPROVED WATER MAP CALCULATION IN SPECTRAL X-RAY

Organization Name

KONINKLIJKE PHILIPS N.V.

Inventor(s)

MATTHIAS Simon of AACHEN DE

BERND Menser of HAUSET BE

WALTER Ruetten of LINNICH DE

KLAUS JÜRGEN Engel of VELDHOVEN NL

DIRK Schaefer of HAMBURG DE

AXEL Thran of HAMBURG DE

IMPROVED WATER MAP CALCULATION IN SPECTRAL X-RAY

This abstract first appeared for US patent application 18719231 titled 'IMPROVED WATER MAP CALCULATION IN SPECTRAL X-RAY

Original Abstract Submitted

System (S-SYS) and related method for determining a material density map for a target material. The system (S-SYS) may receive spectral data representable in a two-dimensional data space. The spectral data may include measurements acquired by a spectral imaging apparatus of an object in a three-dimensional image domain of the spectral imaging apparatus. The system determines clusters in the data space, one indicative of the target material, the target material cluster, and clusters indicative auxiliary materials, the auxiliary material clusters. The system may determine a mutual geometrical constellation of the clusters. The system determines the material density map based on the geometrical constellation so determined.