18712310. PARAMETER GENERATION DEVICE, METHOD AND PROGRAM (NEC Corporation)
PARAMETER GENERATION DEVICE, METHOD AND PROGRAM
Organization Name
Inventor(s)
Hiroshi Chishima of Tokyo (JP)
PARAMETER GENERATION DEVICE, METHOD AND PROGRAM
This abstract first appeared for US patent application 18712310 titled 'PARAMETER GENERATION DEVICE, METHOD AND PROGRAM
Original Abstract Submitted
The input means accepts input of a condition to be satisfied by a parameter. The model generation means converts the input condition into a model represented by a Hamiltonian. The annealing process means generates an Ising model from the converted model and inputs the generated Ising model to an annealing machine to perform annealing. The output means converts an annealing result into the parameter and outputs the parameter.