18703007. QUALITY OF EXPRIENCE MEASUREMENT (Nokia Technologies Oy)
QUALITY OF EXPRIENCE MEASUREMENT
Organization Name
Inventor(s)
Malgorzata Tomala of Wroclaw (PL)
QUALITY OF EXPRIENCE MEASUREMENT
This abstract first appeared for US patent application 18703007 titled 'QUALITY OF EXPRIENCE MEASUREMENT
Original Abstract Submitted
Embodiments of the present disclosure relate to estimating downlink size for Quality of Experience (QoE) measurements. According to embodiments of the present disclosure, a terminal device is able to coordinate between an Access Stratum layer and an Application layer to associate the QoE configuration with the corresponding reports. In this way, enables unique identification of a single QoE configuration, as well as the corresponding QoE report at the terminal device.