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18678296. INSPECTION DEVICE AND INSPECTION SYSTEM (MITSUBISHI HEAVY INDUSTRIES, LTD.)

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INSPECTION DEVICE AND INSPECTION SYSTEM

Organization Name

MITSUBISHI HEAVY INDUSTRIES, LTD.

Inventor(s)

Tomohiro Murai of Tokyo (JP)

Takaaki Hashino of Tokyo (JP)

INSPECTION DEVICE AND INSPECTION SYSTEM

This abstract first appeared for US patent application 18678296 titled 'INSPECTION DEVICE AND INSPECTION SYSTEM

Original Abstract Submitted

An inspection device includes a base facing, in a first direction, a surface to be inspected, a contact section mounted on the base and configured to contact with a seal on the surface, a biasing device mounted on the base and configured to bias the contact section in a second direction, and a reciprocating mechanism at an end portion of the base on the one side and configured to move the base in the second direction. The biasing device includes a rotary shaft extending in a third direction, an arm being rotatable about the rotary shaft, extending at both sides in the second direction with respect to the rotary shaft, and included with the contact section at an end portion on the one side, and a biasing member at an end portion of the arm on the other side and configured to move the contact section in the second direction.

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