Jump to content

18676693. ANALYSIS DEVICE (CANON KABUSHIKI KAISHA)

From WikiPatents

ANALYSIS DEVICE

Organization Name

CANON KABUSHIKI KAISHA

Inventor(s)

JUN Miura of Kanagawa (JP)

MAKOTO Fukatsu of Shizuoka (JP)

TAKESHI Yamamoto of Kanagawa (JP)

MASANORI Tanaka of Kanagawa (JP)

HARUNOBU Maeda of Tokyo (JP)

FUKA Enokido of Kanagawa (JP)

KEIJI Miyazaki of Tokyo (JP)

ANALYSIS DEVICE

This abstract first appeared for US patent application 18676693 titled 'ANALYSIS DEVICE



Original Abstract Submitted

Due to a relationship between a channel wall and an electrode with respect to a porous substrate, it has been difficult to achieve both adhesiveness between the electrode and the substrate and suppression of electrode cracks caused by deformation of the substrate in a high-humidity environment or the like, and an inability to achieve both may inhibit ion concentration measurement from being correctly performed in some cases. Provided is a configuration in which the electrode has at least a part formed inside the porous substrate in an electrode portion that achieves contact with an external measuring instrument and the channel wall is always present on a straight line on which the electrode is present.

Cookies help us deliver our services. By using our services, you agree to our use of cookies.