LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

Organization Name

Inventor(s)

Sebastien Tixier of North Vancouver (CA)

LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY - A simplified explanation of the abstract

This abstract first appeared for US patent application 18653451 titled 'LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

The patent application describes a system with a top scanner head positioned over a coated substrate, where an x-ray sensor and a second x-ray sensor scan the substrate.

The x-ray sensors are tuned to different energy levels, with at least one below and one above an absorption peak.
Both sensors scan the same spot on the substrate for accurate detection.
A bottom scanner head is located underneath the substrate to detect x-rays for the sensors.

Potential Applications: - Quality control in manufacturing processes - Non-destructive testing in various industries - Material analysis and characterization

Problems Solved: - Accurate detection of coating thickness - Efficient scanning of coated substrates - Enhanced quality control measures

Benefits: - Improved accuracy in measuring coating thickness - Increased efficiency in scanning processes - Enhanced quality assurance in manufacturing

Commercial Applications: Title: Advanced Coating Thickness Measurement System This technology can be utilized in industries such as automotive, aerospace, and electronics for quality control and material analysis purposes. It can streamline production processes and ensure consistent product quality.

Questions about the technology: 1. How does the system differentiate between the x-ray sensors' energy levels? - The system is designed to tune each sensor to a specific energy level for optimal detection. 2. What are the advantages of using x-ray sensors for scanning coated substrates? - X-ray sensors provide non-destructive testing capabilities and accurate measurements for various applications.

Original Abstract Submitted

A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.