ANALYSIS DEVICE AND RECORDING MEDIUM

Organization Name

Inventor(s)

ANALYSIS DEVICE AND RECORDING MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18614017 titled 'ANALYSIS DEVICE AND RECORDING MEDIUM

Simplified Explanation

The patent application describes an analysis device that extracts pole frequency, zero point frequency, and low frequency gain from S-parameters of a Device Under Test (DUT) measured using a series-through measurement method. It then calculates circuit constants of an equivalent circuit of the DUT based on these extracted frequencies.

Uses reflection and transmission characteristics of the DUT to extract key frequencies and gain information.
Calculates circuit constants of an equivalent circuit based on the extracted data.
Equivalent circuit assumed to consist of a capacitor in parallel with a resistor and inductor in series.

Key Features and Innovation

Extraction unit utilizes reflection and transmission characteristics to extract key frequencies and gain information.
Calculation unit determines circuit constants of an equivalent circuit based on the extracted data.
Equivalent circuit model includes a capacitor, resistor, and inductor.

Potential Applications

RF circuit design and analysis.
Network analysis and optimization.
Signal integrity testing in high-frequency applications.

Problems Solved

Efficient extraction of key frequencies and gain information from S-parameters.
Simplified calculation of circuit constants for equivalent circuit modeling.

Benefits

Improved accuracy in circuit analysis.
Faster design iteration and optimization.
Enhanced understanding of DUT behavior.

Commercial Applications

Title: RF Circuit Analysis and Design Tool

This technology can be used in industries such as telecommunications, aerospace, and electronics manufacturing for RF circuit design, network analysis, and signal integrity testing. It can streamline the design process, leading to more efficient and reliable RF systems.

Prior Art

There may be prior art related to the use of S-parameters for circuit analysis and equivalent circuit modeling in the field of RF engineering. Researchers and practitioners in this field can explore academic journals, patents, and industry publications for relevant prior art.

Frequently Updated Research

Researchers in the field of RF engineering are constantly exploring new methods for circuit analysis and design. Stay updated on conferences, research papers, and industry developments to learn about the latest advancements in this technology.

Questions about RF Circuit Analysis and Design Tool

How does this technology improve the efficiency of RF circuit design?

This technology streamlines the process by extracting key frequencies and gain information from S-parameters, allowing for faster iteration and optimization of RF circuits.

What are the potential applications of this technology beyond RF circuit design?

This technology can also be applied in network analysis, signal integrity testing, and other high-frequency applications where accurate circuit modeling is essential.

Original Abstract Submitted

An analysis device includes an extraction unit configured to use reflection characteristic and transmission characteristic included in S-parameters of a DUT measured by a series-through measurement method with a frequency characteristic measurement device, so as to extract a pole frequency, a zero point frequency, and a low frequency part of gain that can be approximated as a DC component, from gains and phases of the reflection characteristic and the transmission characteristic; and a calculation unit configured to calculate circuit constants of an equivalent circuit of the DUT, from the pole frequency, the zero point frequency, and the low frequency part. The equivalent circuit is a circuit assumed to be consisting of a capacitor connected in parallel with a serial connection body of a resistor and an inductor.