18584974. CLEARANCE MEASURING APPARATUS (SAMSUNG SDI CO., LTD.)
CLEARANCE MEASURING APPARATUS
Organization Name
Inventor(s)
Yongseung Shin of Yongin-si KR
CLEARANCE MEASURING APPARATUS
This abstract first appeared for US patent application 18584974 titled 'CLEARANCE MEASURING APPARATUS
Original Abstract Submitted
One or more embodiments of the present disclosure provides a clearance-measuring apparatus including an image sensor in a mold including a frame, a punch on the frame and configured to be moved in a vertical direction, and a die on the frame and spaced apart from the punch, the image sensor being configured to capture an image of a space between the punch and the die, and a controller configured to measure a clearance of the punch and the die based on the image.