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18582764. METHOD AND KIT FOR GENETIC ANALYSIS (Hitachi, Ltd.)

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METHOD AND KIT FOR GENETIC ANALYSIS

Organization Name

Hitachi, Ltd.

Inventor(s)

Junko Tanaka of Tokyo (JP)

Tatsuo Nakagawa of Tokyo (JP)

METHOD AND KIT FOR GENETIC ANALYSIS

This abstract first appeared for US patent application 18582764 titled 'METHOD AND KIT FOR GENETIC ANALYSIS



Original Abstract Submitted

A method and kit for genetic analysis can accurately determine whether a plurality of genetic mutations in close proximity are present in a positional relationship of a cis-form or a trans-form and quantify the genetic mutations. The method for genetic analysis includes: preparing probes corresponding to each of a plurality of genetic mutations; performing an amplification reaction using a solution comprising a primer for amplifying a region comprising the plurality of genetic mutations, the probes, a test biological sample, and an enzyme; measuring a binding of an amplicon to the probe by melting curve analysis at varying temperatures of the solution after performing the amplification reaction; and determining, based on a result of the melting curve analysis, whether the plurality of genetic mutations are on a same allele in a cis form or on different alleles in a trans form in DNA contained in the test biological sample.

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