18533142. FUNCTIONAL TESTING DEVICE AND SYSTEM (INVENTEC CORPORATION)
FUNCTIONAL TESTING DEVICE AND SYSTEM
Organization Name
Inventor(s)
Chih-Jen Chin of Taipei City (TW)
Cheng-Hung Wu of Taipei City (TW)
Yi-Ping Yang of Taipei City (TW)
FUNCTIONAL TESTING DEVICE AND SYSTEM
This abstract first appeared for US patent application 18533142 titled 'FUNCTIONAL TESTING DEVICE AND SYSTEM
Original Abstract Submitted
A functional testing device includes a substrate, a plurality of connection ports, an input/output module, a main control module and a power module. The plurality of connection ports are disposed on the substrate. The input/output module is disposed on the substrate and configured to receive at least one test script. The main control module is disposed on the substrate and connected to the plurality of connection ports, the main control module is configured to output a plurality of testing signals to at least one of the plurality of connection ports according to the at least one test script. The power module is disposed on the substrate and configured to receive and transmit power to the main control module.