18524265. Pruning Ray Tracing Traversal Operations based on Local Ray Parameter Value (Apple Inc.)
Pruning Ray Tracing Traversal Operations based on Local Ray Parameter Value
Organization Name
Inventor(s)
Ali Rabbani Rankouhi of Bushey GB
Luca O. Iuliano of Milton Keynes GB
David J. Bermingham of Cambridge GB
Christopher A. Burns of Austin TX US
Pruning Ray Tracing Traversal Operations based on Local Ray Parameter Value
This abstract first appeared for US patent application 18524265 titled 'Pruning Ray Tracing Traversal Operations based on Local Ray Parameter Value
Original Abstract Submitted
Techniques are disclosed relating to graphics processors that support ray tracing. In disclosed embodiments, ray intersect circuitry is configured to access a traversal stack used for traversal of multiple levels of a bounding volume hierarchy (BVH) acceleration data structure (ADS) according to a depth-first search to retrieve: coordinates of a first bounding region for a child node and a local ray parameter value that indicates a point along a ray at which an intersection with a second bounding region for the child node's parent node was detected. The accelerator circuitry may compare the local ray parameter value with an end ray parameter value to determine whether to traverse to the child node as part of traversal of the BVH.
