18523433. Memory Validation simplified abstract (WAYMO LLC)

Memory Validation

Organization Name

WAYMO LLC

Inventor(s)

Sabareeshkumar Ravikumar of Sunnyvale CA (US)

Shishuang Sun of Cupertino CA (US)

Feng Wang of San Jose CA (US)

Ji Zhang of Santa Clara CA (US)

Memory Validation - A simplified explanation of the abstract

This abstract first appeared for US patent application 18523433 titled 'Memory Validation

Simplified Explanation

The abstract of the patent application describes a method of testing an electrical device by transmitting a data pattern to the device's memory, reading the data pattern, and comparing it to the original pattern.

• The method involves transmitting a data pattern to the memory device of an electrical device.
• The data pattern replicates a resonant frequency of at least a portion of the electrical device.
• The written data pattern is read from the memory device and compared to the original data pattern.

Potential Applications

This technology could be applied in the testing and quality control of electrical devices to ensure they are functioning properly and within specified resonant frequencies.

Problems Solved

This method helps in identifying any discrepancies or malfunctions in the electrical device by comparing the written data pattern to the original, allowing for efficient troubleshooting and maintenance.

Benefits

The method provides a reliable and accurate way to test electrical devices, ensuring they meet performance standards and operate within specified resonant frequencies.

Potential Commercial Applications

This technology could be utilized in various industries such as electronics manufacturing, automotive, aerospace, and telecommunications for testing and quality assurance purposes.

Possible Prior Art

One possible prior art could be the use of data patterns to test memory devices in electronic systems, but the specific application of replicating resonant frequencies for testing electrical devices may be a novel approach.

How does this method impact the overall efficiency of testing electrical devices?

This method can streamline the testing process by providing a quick and accurate way to identify any issues with the electrical device, ultimately saving time and resources.

What are the potential limitations or challenges of implementing this testing method in different types of electrical devices?

The method may face challenges in adapting to various types of electrical devices with different resonant frequencies or memory configurations, requiring customization for each application.

Original Abstract Submitted

One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.