18518965. SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD simplified abstract (SHIMADZU CORPORATION)
SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD
Organization Name
Inventor(s)
SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18518965 titled 'SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD
Simplified Explanation
The spectrum analysis system described in the patent application includes a measurer, a display, and a controller. The controller is able to display a plurality of first anomaly items that indicate the type of anomaly in the appearance of the measurement spectrum waveform. Additionally, the controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each of the plurality of first anomaly items in the display.
- Measurer, display, and controller components in the spectrum analysis system
- Display of first anomaly items indicating anomaly type in spectrum waveform
- Display of first reference spectrum waveform for reference to anomaly appearance modes
Potential Applications
The technology described in this patent application could be applied in various industries and fields, including:
- Signal processing
- Quality control in manufacturing
- Environmental monitoring
- Medical diagnostics
Problems Solved
This technology helps in identifying anomalies in spectrum waveforms, which can be crucial in various applications such as:
- Detecting faults in machinery
- Monitoring changes in environmental conditions
- Diagnosing abnormalities in medical tests
Benefits
The benefits of this technology include:
- Improved accuracy in anomaly detection
- Enhanced visualization of spectrum waveforms
- Efficient troubleshooting and problem-solving
Potential Commercial Applications
With its ability to accurately detect anomalies in spectrum waveforms, this technology could be valuable in commercial applications such as:
- Equipment maintenance and monitoring systems
- Quality control systems in manufacturing
- Medical imaging and diagnostic equipment
Possible Prior Art
One possible prior art related to this technology is the use of spectrum analysis systems in various industries for signal processing and anomaly detection. Older versions of spectrum analyzers and waveform displays may have similarities to the system described in this patent application.
Unanswered Questions
How does the controller determine the mode of appearance of each anomaly?
The patent application mentions that the controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each anomaly item, but it does not elaborate on the specific method used for this determination.
Are there any limitations to the types of anomalies that can be detected by this system?
While the patent application discusses the display of a plurality of first anomaly items, it does not specify if there are any restrictions on the types of anomalies that can be identified using this technology.
Original Abstract Submitted
This spectrum analysis system has a measurer, a display, and a controller that displays plurality of first anomaly items that indicate the type of anomaly in appearance of the measurement spectrum waveform. The controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each of the plurality of first anomaly items in the display.
