18503898. ROOT CAUSE ANALYSIS FRAMEWORK IN INDUSTRIAL PROCESS ANALYTICS (Rockwell Automation Technologies, Inc.)
ROOT CAUSE ANALYSIS FRAMEWORK IN INDUSTRIAL PROCESS ANALYTICS
Organization Name
Rockwell Automation Technologies, Inc.
Inventor(s)
Dennis J. Luo of Germantown WI US
Justice Darko of Charlotte NC US
Ankan Chowdhury of Pimpri-Chinchwad IN
Tasha Markovich of North Royalton OH US
Fatime Ly Seymour of Charlotte NC US
Francisco P. Maturana of Lyndhurst OH US
ROOT CAUSE ANALYSIS FRAMEWORK IN INDUSTRIAL PROCESS ANALYTICS
This abstract first appeared for US patent application 18503898 titled 'ROOT CAUSE ANALYSIS FRAMEWORK IN INDUSTRIAL PROCESS ANALYTICS
Original Abstract Submitted
A method may include receiving, via graphical user interface (GUI) of a processing system, a selection of a dataset associated with one or more operations of one or more industrial automation components of an industrial system. The method may also include receiving, via the GUI of the processing system, a set of input variables associated with the dataset, receiving a target variable associated with the dataset, and receiving a model type for analyzing the dataset. The method may also involve determining, via the processing system, a contribution of each of the set of input variables to the target variable based on the model type; and generating, via the processing system, a visualization representative of one or more statistical relationships between each of the set of input variables and the target variable based on the contribution of each of the set of input variables to the target variable.
- Rockwell Automation Technologies, Inc.
- Meiling He of Shorewood WI US
- Dennis J. Luo of Germantown WI US
- Justice Darko of Charlotte NC US
- Ishit Patni of Pune IN
- Ankan Chowdhury of Pimpri-Chinchwad IN
- Tasha Markovich of North Royalton OH US
- Fatime Ly Seymour of Charlotte NC US
- Francisco P. Maturana of Lyndhurst OH US
- G05B19/418
- CPC G05B19/4184