18497464. DELAY ELEMENT GAIN CALIBRATION (QUALCOMM Incorporated)
DELAY ELEMENT GAIN CALIBRATION
Organization Name
Inventor(s)
Yunliang Zhu of San Diego CA US
DELAY ELEMENT GAIN CALIBRATION
This abstract first appeared for US patent application 18497464 titled 'DELAY ELEMENT GAIN CALIBRATION
Original Abstract Submitted
Certain aspects of the present disclosure are directed towards a method for delay element calibration. The method generally includes: incrementing a calibration delay control signal provided to a delay element to generate an output clock signal by delaying an input clock signal; comparing, via a phase detector (PD), the input clock signal and the output clock signal to generate a PD output signal; and accumulating, via a first accumulator, the PD output signal to generate a calibration output signal.