18492962. SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM (Rohde & Schwarz GmbH & Co. KG)
SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM
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SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM
This abstract first appeared for US patent application 18492962 titled 'SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM
Original Abstract Submitted
A method of manufacturing an electric circuit includes: providing a signal conductor on a first side of a substrate; providing a resistor structure on the first side of the substrate, the resistor structure contacting the signal conductor; providing a first contacting structure on the first side of the substrate, the first contacting structure electrically connected to the resistor structure by a first electric connection, the first electric connection at least partially provided on the second side of the substrate; applying a test signal to the resistor structure via a measurement circuit contacting the first contacting structure and the signal conductor; determining at least one characteristic property of the first resistor structure based on the test signal; and trimming the resistor structure until the at least one characteristic property has a predefined nominal value or is less than a predefined nominal value by less than a predefined threshold.