18487551. SYSTEM AND METHOD FOR TESTING MEMORY DEVICE (NANYA TECHNOLOGY CORPORATION)
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
Organization Name
Inventor(s)
Jui-Chung Hsu of Taoyuan City TW
Wei Chuan Chen of Taipei City TW
Wan-Chun Fang of Taoyuan City TW
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
This abstract first appeared for US patent application 18487551 titled 'SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
Original Abstract Submitted
A system including memory devices and a tester is provided. The tester is configured to: generate a first multi-purpose command to the memory devices and a first data signal to each of a first group in the memory devices to store a first identity; generate a second multi-purpose command to the memory devices and the first data signal to each of a second group in the memory devices to store a second identity; generate a third multi-purpose command and a fourth multi-purpose command to the memory devices to select the first and second groups in the memory devices to have first and second time shifts in write leveling pulses therein separately; transmit a write datum to the memory devices for performing a write operation to the memory devices; and receive read data and compare the write datum and the read data for a test result.