MEASUREMENT CIRCUIT FOR SURFACE CODE

Organization Name

Microsoft Technology Licensing, LLC

Inventor(s)

Parsa Bonderson of Santa Barbara CA US

David Alexander Aasen of Santa Barbara CA US

Anna Linnea Graens Samuelsson of Goleta CA US

Christina Paulsen Knapp of Goleta CA US

Marcus Palmer da Silva of Redmond WA US

Bradley Curtis Lackey of Redmond WA US

MEASUREMENT CIRCUIT FOR SURFACE CODE

This abstract first appeared for US patent application 18485273 titled 'MEASUREMENT CIRCUIT FOR SURFACE CODE

Original Abstract Submitted

A method for enacting a measurement circuit of a surface code on a plaquette of qubits of a qubit lattice comprises: (a) distributing among a sequence of time steps a set of one-qubit projective measurements on each of three auxiliary qubits of the plaquette; (b) distributing among the sequence of time steps a set of two-qubit projective measurements on each of four data qubits of the plaquette together with one of the three auxiliary qubits; (c) distributing among the sequence of time steps a set of two-qubit projective measurements on two or more auxiliary-qubit pairs selected from the three auxiliary qubits of the plaquette; and (d) advancing through each of the time steps of the sequence, executing the one- and two-qubit projective measurements distributed therein. In this method the measurement circuit corresponds to a stabilizer of the surface code, and the measurements generate measurement of a stabilizer operator.