18480968. MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS (GE Precision Healthcare LLC)
MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
Organization Name
Inventor(s)
Changlyong Kim of Brookfield WI US
Tyler Egan Curtis of Wauwatosa WI US
Fengchao Zhang of Hartland WI US
Jiahua Fan of New Berlin WI US
Erik Fredenberg of Stockholm SE
Johannes Loberg of Stockholm SE
[[:Category:Björn Cederstr�m of Stockholm SE|Björn Cederstr�m of Stockholm SE]][[Category:Björn Cederstr�m of Stockholm SE]]
MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
This abstract first appeared for US patent application 18480968 titled 'MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
Original Abstract Submitted
An X-ray imaging system, such as a computed tomography (CT) computed tomography (CT) imaging system is provided for material decomposition calibration and intended for use with a calibration phantom. The X-ray imaging system comprises an X-ray source configured to emit X-rays and an X-ray detector arranged in the X-ray beam path configured to generate detector data. The calibration phantom is located in the X-ray beam path. The X-ray imaging system further comprises an X-ray beam limiting device including at least one calibration element in the X-ray beam path. The X-ray imaging system also comprises image processing circuitry configured to acquire projection data for a set of projections based on the detector data, and to determine pathlengths through at least one material of the at least one calibration element and at least one material of the calibration phantom, at least partly based on acquired projection data, for performing material decomposition calibration.