18479848. Thermal reference correction (Apple Inc.)
Thermal reference correction
Organization Name
Inventor(s)
David Pawlowski of Tel Aviv IL
Roey Zuitlin of Kfar Bin Nun IL
Gidi Lasovski of Ramat Hasharon IL
Boris Morgenstein of Tel Aviv IL
Thermal reference correction
This abstract first appeared for US patent application 18479848 titled 'Thermal reference correction
Original Abstract Submitted
A method for depth mapping includes operating a projector at a first temperature to project a pattern of optical radiation onto a reference plane, capturing a first image of the projected pattern on the reference plane, using the first image and an optical and thermal model of the projector to compute multiple reference images associated with different respective temperatures of the projector. Using the projector, the pattern is projected onto a scene, and a temperature of the projector is measured while projecting the pattern. The method further includes capturing a second image of the projected pattern on the scene, selecting one of the reference images responsively to the measured temperature; and computing a depth map of the scene by comparing the pattern in the second image to the selected one of the reference images.