MULTI-ARCHITECTURE RAPID TESTING FRAMEWORK

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MULTI-ARCHITECTURE RAPID TESTING FRAMEWORK

This abstract first appeared for US patent application 18467187 titled 'MULTI-ARCHITECTURE RAPID TESTING FRAMEWORK

Original Abstract Submitted

Examples provide a computer system including an electronic processor configured to obtain a set of source code and a plurality of test scenarios. Each of the plurality of test scenarios specifies a respective build architecture. For each respective test scenario of the plurality of test scenarios, the electronic processor is configured to instantiate a respective build environment according to the respective build architecture, compile the set of source code in the respective build environment to generate a respective binary file, and generate a respective set of one or more metrics for the respective binary file.