18467108. SYSTEMS AND METHODS FOR APPLICATION MONITORING (Capital One Services, LLC)
SYSTEMS AND METHODS FOR APPLICATION MONITORING
Organization Name
Inventor(s)
Sekhar Prasad Gurrapu of Wilmington DE US
Bhaskar Banerjee of Plano TX US
Kevin P. Poffenberger of Townsend DE US
SYSTEMS AND METHODS FOR APPLICATION MONITORING
This abstract first appeared for US patent application 18467108 titled 'SYSTEMS AND METHODS FOR APPLICATION MONITORING
Original Abstract Submitted
Disclosed embodiments may include a system for monitoring applications. The system may receive first data associated with a first application. Responsive to receiving the first data, the system may retrieve second data associated with the first application. The system may generate third data associated with the first application by analyzing the second data via natural language processing (NLP). The system may train a machine learning model (MLM) to determine a first threshold associated with the first application based on the third data. The system may transmit the first threshold to a user. Responsive to transmitting the first threshold, the system may receive fourth data associated with a second application. The system may determine, via the MLM and based on the fourth data, an updated first threshold associated with the second application.
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