18441264. SEMICONDUCTOR SYSTEM RELATED TO PERFORMING AN ERROR CHECK SCRUB OPERATION (SK hynix Inc.)
SEMICONDUCTOR SYSTEM RELATED TO PERFORMING AN ERROR CHECK SCRUB OPERATION
Organization Name
Inventor(s)
Choung Ki Song of Icheon-si Gyeonggi-do KR
SEMICONDUCTOR SYSTEM RELATED TO PERFORMING AN ERROR CHECK SCRUB OPERATION
This abstract first appeared for US patent application 18441264 titled 'SEMICONDUCTOR SYSTEM RELATED TO PERFORMING AN ERROR CHECK SCRUB OPERATION
Original Abstract Submitted
A semiconductor system includes a controller outputting a chip selection signal and a command address for performing a read operation and then outputting the chip selection signal and the command address for performing an ECS operation, and a semiconductor device including a plurality of memory cells and generating a latch row address and a latch column address by latching the command address when an error occurs in internal data that are output from a memory cell that is selected, among a plurality of memory cells, after the start of the read operation based on the chip selection signal and the command address, determining the priority of the ECS operation for the plurality of memory cells based on the latch row address and the latch column address, and storing the internal data in the same memory cell again by correcting the error of the internal data.
