18435515. DISPLACEMENT MEASUREMENT USING MILLIMETER-WAVE METAMATERIAL TARGETS simplified abstract (Infineon Technologies AG)

DISPLACEMENT MEASUREMENT USING MILLIMETER-WAVE METAMATERIAL TARGETS

Organization Name

Infineon Technologies AG

Inventor(s)

Dirk Hammerschmidt of Finkenstein (AT)

Christof Michenthaler of Feistritz an der Gail (AT)

DISPLACEMENT MEASUREMENT USING MILLIMETER-WAVE METAMATERIAL TARGETS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18435515 titled 'DISPLACEMENT MEASUREMENT USING MILLIMETER-WAVE METAMATERIAL TARGETS

Simplified Explanation: The patent application describes a sensor system that utilizes a metamaterial layer to convert electromagnetic waves, allowing for the determination of relative positions.

Key Features and Innovation:

• Sensor system with transmitter, receiver circuit, and metamaterial layer.
• Metamaterial layer contains elementary structures with varying characteristics.
• Transmitter sends electromagnetic waves to the metamaterial layer.
• Metamaterial layer converts the waves into receive waves based on relative position.
• Receiver circuit analyzes receive waves to determine relative position.

Potential Applications: This technology could be used in:

• Radar systems
• Wireless communication
• Object detection
• Position tracking
• Remote sensing

Problems Solved:

• Enhances accuracy of position determination
• Improves signal conversion efficiency
• Enables precise object detection

Benefits:

• Increased precision in sensor systems
• Enhanced performance in communication devices
• Improved reliability in tracking applications

Commercial Applications: Potential commercial uses include:

• Automotive radar systems
• Satellite communication devices
• Security systems
• Drone navigation technology

Prior Art: Readers can explore prior research on metamaterials, sensor systems, and electromagnetic wave conversion technologies to understand the background of this innovation.

Frequently Updated Research: Stay updated on advancements in metamaterial technology, sensor system applications, and electromagnetic wave manipulation for potential insights into future developments.

Questions about Sensor Systems with Metamaterial Layers: 1. How does the metamaterial layer impact the accuracy of position determination in sensor systems? 2. What are the potential challenges in integrating metamaterial layers into existing communication devices?

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Original Abstract Submitted

A sensor system includes at least one transmitter; a receiver circuit; and a metamaterial layer having a relative position that is configured to vary relative to the transmitter. The metamaterial layer includes an array of elementary structures arranged within a coordinate system of the metamaterial layer. The array of elementary structures includes a first metamaterial characteristic that changes along a first coordinate variation of the coordinate system and a second metamaterial characteristic, different from the first metamaterial characteristic, that changes along a second coordinate variation of the coordinate system. The at least one transmitter is configured to transmit an electromagnetic transmit wave toward the metamaterial layer. The metamaterial layer is configured to convert the electromagnetic transmit wave into an electromagnetic receive wave based on the relative position. The receiver circuit is configured to receive the electromagnetic receive wave and determine the relative position based on the electromagnetic receive wave.