18435497. ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD simplified abstract (Tokyo Electron Limited)
ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD
Organization Name
Inventor(s)
Motoi Okada of Sapporo City (JP)
ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18435497 titled 'ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD
Simplified Explanation: The abnormality detection apparatus described in the patent application generates pseudo-abnormal image data to detect abnormalities in equipment that supplies liquid. By synthesizing abnormal images and creating a determination model, the apparatus can identify abnormalities in the equipment based on the acquired image data.
- The apparatus generates pseudo-abnormal image data by creating abnormal images within normal image data.
- A determination model is developed to distinguish between normal and abnormal equipment based on the synthesized data.
- The apparatus acquires image data of the equipment to detect abnormalities using the determination model.
Key Features and Innovation:
- Generation of pseudo-abnormal image data for abnormality detection.
- Development of a determination model to identify abnormalities in equipment.
- Acquiring image data to detect abnormalities in the equipment.
Potential Applications: The technology can be applied in various industries such as manufacturing, healthcare, and security for equipment monitoring and maintenance.
Problems Solved: The technology addresses the challenge of efficiently detecting abnormalities in equipment to prevent potential malfunctions or failures.
Benefits:
- Early detection of abnormalities in equipment.
- Improved maintenance and monitoring processes.
- Enhanced equipment reliability and safety.
Commercial Applications: The technology can be utilized in industries such as manufacturing plants, hospitals, and security facilities for proactive equipment maintenance and safety measures.
Questions about Abnormality Detection Technology: 1. How does the abnormality detection apparatus generate pseudo-abnormal image data? 2. What are the potential applications of this technology in different industries?
Frequently Updated Research: Ongoing research in the field of abnormality detection technology focuses on enhancing the accuracy and efficiency of detecting abnormalities in various types of equipment.
Original Abstract Submitted
An abnormality detection apparatus is provided. The abnormality detection apparatus includes a first generation part configured to generate pseudo-abnormal image data by synthesizing a substantially circular image at a random position of an image of normal image data obtained by photographing equipment that includes a liquid supply and supplies a liquid from the liquid supply without an abnormality, a second generation part configured to generate a determination model for determining whether the equipment is normal or abnormal by performing learning of the normal image data and the pseudo-abnormal image data, an acquisition part configured to acquire image data obtained by photographing the equipment, and a detection part configured detect an abnormality in the equipment from the image data acquired by the acquisition part using the determination model.