18406922. FAIL DATA AUGMENTATION DEVICE AND METHOD FOR RANDOM ACCESS MEMORY (SK hynix Inc.)
FAIL DATA AUGMENTATION DEVICE AND METHOD FOR RANDOM ACCESS MEMORY
Organization Name
Inventor(s)
Seung Yeol Lee of Gyeonggi-do (KR)
Jung Soo Kim of Gyeonggi-do (KR)
Chang Hoon Lee of Gyeonggi-do (KR)
FAIL DATA AUGMENTATION DEVICE AND METHOD FOR RANDOM ACCESS MEMORY
This abstract first appeared for US patent application 18406922 titled 'FAIL DATA AUGMENTATION DEVICE AND METHOD FOR RANDOM ACCESS MEMORY
Original Abstract Submitted
A fail data augmentation device may input a plurality of fail data units to a data augmentation model, obtain a plurality of augmented fail data units outputted from the data augmentation model, and delete one or more of the augmented fail data units. The plurality of fail data units and the plurality of augmented fail data units includes a first parameter indicating one of a plurality of banks included in a random access memory, a second parameter indicating one of a plurality of matrices included in the bank corresponding to the first parameter, and a third parameter indicating one of a plurality of hex units included in the matrix corresponding to the second parameter respectively.
