IMAGE SENSOR WITH TEST CIRCUIT

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IMAGE SENSOR WITH TEST CIRCUIT - A simplified explanation of the abstract

This abstract first appeared for US patent application 18391062 titled 'IMAGE SENSOR WITH TEST CIRCUIT

The patent application describes an image sensor with a pixel array that generates analog signals in response to light, an analog-to-digital converter to convert these signals to digital, and a test circuit to test the counting operation of the converter.

Pixel array generates analog signals in response to light
Analog-to-digital converter converts analog signals to digital
Test circuit changes reset code based on horizontal time period
Reset code corresponds to counting value during test mode
Test circuit tests counting operation of the converter based on reset code changes

Potential Applications: - Digital cameras - Surveillance systems - Medical imaging devices

Problems Solved: - Ensures accurate conversion of analog signals to digital - Verifies proper counting operation of the converter

Benefits: - Improved image quality - Enhanced performance of the image sensor - Reliable operation in various lighting conditions

Commercial Applications: Title: "Advanced Image Sensor Technology for Enhanced Digital Imaging" This technology can be utilized in digital cameras, security cameras, medical imaging devices, and other applications requiring high-quality image capture.

Questions about Image Sensor Technology: 1. How does the test circuit ensure the accuracy of the counting operation? The test circuit changes the reset code based on a horizontal time period to verify the proper counting operation of the analog-to-digital converter.

2. What are the potential benefits of using this image sensor technology in medical imaging devices? This technology can improve image quality, ensuring accurate and reliable results in medical imaging applications.

Original Abstract Submitted

Provided is an image sensor including a pixel array that includes a plurality of pixels, wherein each of the plurality of pixels is configured to generate an analog signal in response to incident light; an analog-to-digital converter that includes a counter, wherein the analog-to-digital converter is configured to convert the analog signal into a digital signal; and a test circuit that is configured to change a reset code according to a horizontal time period, wherein the reset code corresponds to a first counting value during a reset time period of a test mode according to a count clock signal, and wherein the test circuit is configured to test a counting operation of the counter based on the reset code that changes according to the horizontal time period.