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18383712. MODEL BASED ERROR AVOIDANCE (Micron Technology, Inc.)

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MODEL BASED ERROR AVOIDANCE

Organization Name

Micron Technology, Inc.

Inventor(s)

Li-Te Chang of San Jose CA US

Charles S. Kwong of Redwood City CA US

Wei Wang of Dublin CA US

Murong Lang of San Jose CA US

Shenming Zhou of San Jose CA US

MODEL BASED ERROR AVOIDANCE

This abstract first appeared for US patent application 18383712 titled 'MODEL BASED ERROR AVOIDANCE

Original Abstract Submitted

Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to perform adaptive read level threshold voltage operations. The controller determines a first read level offset associated with reading a first set of data from a first level using a first read level of a plurality of read levels. The controller applies the first read level offset to a machine learning model to estimate a second read level offset, associated with reading a second set of data from a second level of the plurality of levels, using a second read level of the plurality of read levels. The controller updates, based on the first read level offset and the estimated second read level offset, a look-up table that includes a set of read level offsets used to read data from the plurality of levels of the individual component.

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