HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE

Organization Name

Microsoft Technology Licensing, LLC

Inventor(s)

Eoin Conor O’farrell of Frederiksberg (DK)

Roland Zeisel of Copenhagen (DK)

Roman Mykolayovych Lutchyn of Santa Barbara CA (US)

Tom Marijn Laeven of Delft (NL)

Kevin Alexander Van Hoogdalem of Alphen aan den Rijn (NL)

Naganivetha Thiyagarajah of Copenhagen (DK)

Andrey Antipov of Santa Barbara CA (US)

William Scott Cole, Jr. of Sammamish WA (US)

HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18322189 titled 'HYBRID WIRE LOCALIZATION LENGTH MEASUREMENT DEVICE

The abstract describes a superconductor-semiconductor device with a hybrid superconductor-semiconductor wire and a hybrid localization length (LL) measurement device.

The device includes a plurality of contact gates above the hybrid superconductor-semiconductor wire in a thickness direction.
A conductance sensor is electrically coupled to the contact gates.
The device allows for measuring the localization length in the hybrid superconductor-semiconductor wire.

Potential Applications:

Quantum computing
High-speed electronics
Sensing technologies

Problems Solved:

Enhancing quantum computing capabilities
Improving electronic device performance
Advancing sensor technologies

Benefits:

Increased efficiency in quantum computing
Enhanced performance of electronic devices
Improved accuracy in sensing applications

Commercial Applications:

Semiconductor industry
Quantum computing research labs
Sensor technology companies

Questions about the technology: 1. How does the hybrid superconductor-semiconductor wire improve quantum computing capabilities? 2. What are the potential challenges in scaling up this technology for commercial applications?

Original Abstract Submitted

A superconductor-semiconductor device is provided, including a hybrid superconductor-semiconductor wire. The superconductor-semiconductor device may further include a hybrid localization length (LL) measurement device including a plurality of contact gates located above the hybrid superconductor-semiconductor wire in a thickness direction. The hybrid LL measurement device may further include a conductance sensor electrically coupled to the plurality of contact gates.